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contact information and telephone numbers for emf



Operating Instructions
These manuals provide information on proper usage of the equipment in the Electron Microscopy Facility Laboratories. They are in Adobe Acrobat format (*.pdf), which you will need to download if it is not already installed on your system. Click on the icon below to open a new browser window from which you can download the Adobe Acrobat reader for free.
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(file size indicated in parentheses)

Hardware Instructions:
- Denton Desk II Cold Sputter Unit Operating Instructions (17KB)
- JEOL 100S TEM Microscope (29KB)
- JEOL T200 SEM Microscope Operating Instructions (20KB)
- Nikon PCM2000 Confocal Operating Instructions (115KB)
- Tousimis Samdri 780A Critical Point Dryer Operating Instructions (32KB)

Reference Materials:
- Common Fluorescent Dye Characteristics (21KB)

Exams to become an Unsupervised User of the EMF:
- JEOL 100S Unsupervised User Exam (8KB)
- Zeiss 10C TEM Unsupervised User Exam
- JEOL T200 SEM Unsupervised User Exam
- Phillips 505 SEM Unsupervised User Exam

Archived Instrument Instructions:
- Arkay N2 Negative Processor Operating Instructions (13KB)
- Hitachi H7000/7110 TEM Scan microscope (57KB)

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richard e. edelmann, ph.d.,
director
matt l. duley, m.s.,
emf specialist
questions? comments?
edelmare@muohio.edu
350 pearson hall
513.529.5712


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