equipment:

scanning electron microscopy

• JEOL JSM-840A SEM
     ( Click here for instruction manual )


• Electron Sources: Tungsten Hairpin
• Imaging Modes: Secondary Electron, Backscattered Electron Accelerating
• Voltages: 1.0-40 kV, 100ev Steps
• Working Distances: 8mm, 20mm, and 45mm
• Magnifications: 15x - 50,000x
• Image Recording:
• Orion Digital Capture Interface: Fast and Slow Scan
• Polaroid 4" x 5" sheet camera
• NTSC Composite video output
• EDAX EDAM II Energy Dispersive x-ray microanalysis system

• Zeiss Supra 35 VP FEG SEM - Purchased in 2005
     ( Click here for instruction manual )


• Electron Sources: Schottky Field Emission
• Imaging Modes: Secondary Electron (SE), Backscattered Electron (QBSD), VPSE, In-lens SE
• Accelerating Voltages: 0.1 - 30 kV by 0.01 kV steps
• Probe Current: 4 pA to 20nA
• Working Distances: 0.1 - 50mm
• Magnifications: 12x - 900,000x
• Stage: X=125mm, Y=100mm, Z=35mm, T=0 to 90
• Image Recording:512 x 384 to 3072 x 2304 pixels at 16-bit
• EDAX Genesis 2000 Energy Dispersive x-ray microanalysis system
• HKL Channel 5 Electron Backscattered Diffraction System (EBSD)