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equipment:
transmission electron microscopy
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JEOL JEM-2100 TEM/STEM
[ Click here for instruction manual]
- Electron Sources: Lab6
- Accelerating Voltages: 70 to 200 kV
- Imaging Modes: Brightfield, Darkfield, SAD, STEM, EFTEM
- Specimen Stage: Motorized, SEG with ± 75° tilt
- Single & Double tilt holders
- Magnifications: 500x - 1,500,000X, GIF mag 16X
- Detectors:
- Gatan 833 Orius (2K x 2K)
- JEOL BF STEM Detector
- GATAN HAADF STEM Detector
- Gatan GIF Tridiem Post-Column Energy Filter EELS/EFTEM
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Zeiss 10C TEM
[ Click here for instruction manual]
- Electron Source: Tungsten Hairpin
- Accelerating Voltages: 40, 60, 80, and 100 kV
- Imaging Modes: Brightfield, Darkfield, SAD, HR SAD
- Specimen Stage:
- Top entry goniometer
- Standard stage ± 60° High tilt stage with foot switch
- Rotational stage with foot switch
- Magnifications: 1000x - 250,000x
- Image Recording:
- 3.25" x 4" sheet film
- 70mm roll film
- SONY CCD camera, RS-170 composite/non-composite video output
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JEOL JEM-100S TEM
[ Click here for instruction manual]
- Electron Sources: Tungsten Hairpin
- Accelerating Voltages: 40, 60, 80, and 100 kV
- Imaging Modes: Brightfield, Darkfield, SAD
- Specimen Stage: SEG with ± 10° tilt
- Magnifications: 500x - 200,000X
- Image Recording: 3.25" x 4" sheet film
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Click on a category for details on the equipment in the Electron Microscopy Facility:
- Light and Electronic-Light Microscopy
- Scanning Electron Microscopy
- Transmission Electron Microscopy
- Cryopreservation
- Photographic Equipment
- Image Scanners
- Computers / Digital Imaging
- Color Printers
- Equipment for sample preparation
- Laboratory equipment
Go to the Reference Library page for online manuals for specific units
< Back to the Equipment Page >
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