equipment:

transmission electron microscopy

JEOL JEM-2100 TEM/STEM
   [ Click here for instruction manual]
  • Electron Sources: Lab6
  • Accelerating Voltages: 70 to 200 kV
  • Imaging Modes: Brightfield, Darkfield, SAD, STEM, EFTEM
  • Specimen Stage: Motorized, SEG with ± 75° tilt
    • Single & Double tilt holders
  • Magnifications: 500x - 1,500,000X, GIF mag 16X
  • Detectors:
    • Gatan 833 Orius (2K x 2K)
    • JEOL BF STEM Detector
    • GATAN HAADF STEM Detector
    • Gatan GIF Tridiem Post-Column Energy Filter EELS/EFTEM

Zeiss 10C TEM
   [ Click here for instruction manual]
  • Electron Source: Tungsten Hairpin
  • Accelerating Voltages: 40, 60, 80, and 100 kV
  • Imaging Modes: Brightfield, Darkfield, SAD, HR SAD
  • Specimen Stage:
    • Top entry goniometer
    • Standard stage ± 60° High tilt stage with foot switch
    • Rotational stage with foot switch
  • Magnifications: 1000x - 250,000x
  • Image Recording:
    • 3.25" x 4" sheet film
    • 70mm roll film
    • SONY CCD camera, RS-170 composite/non-composite video output

Zeiss 10C TEM photo


JEOL 100S TEM photo JEOL JEM-100S TEM
   [ Click here for instruction manual]
  • Electron Sources: Tungsten Hairpin
  • Accelerating Voltages: 40, 60, 80, and 100 kV
  • Imaging Modes: Brightfield, Darkfield, SAD
  • Specimen Stage: SEG with ± 10° tilt
  • Magnifications: 500x - 200,000X
  • Image Recording: 3.25" x 4" sheet film
Click on a category for details on the equipment in the
Electron Microscopy Facility:


- Light and Electronic-Light Microscopy
- Scanning Electron Microscopy
- Transmission Electron Microscopy
- Cryopreservation
- Photographic Equipment
- Image Scanners
- Computers / Digital Imaging
- Color Printers
- Equipment for sample preparation
- Laboratory equipment

Go to the Reference Library page for online manuals for specific units

< Back to the Equipment Page >



richard e. edelmann, ph.d.,
director
matt l. duley, m.s.,
emf specialist
 
questions? comments?
edelmare@muohio.edu
364 pearson hall
513.529.5712


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