emf - 2 : equipment

equipment: transmission electron microscopy
	• JEOL 100S TEM [ Click here for instruction manual] Electron Sources: Tungsten Hairpin Accelerating Voltages: 40, 60, 80, and 100 kV Imaging Modes: Brightfield, Darkfield, SAD Specimen Stage: SEG with ± 10° tilt Magnifications: 500x - 200,000X Image Recording: 3.25" x 4" sheet film
Zeiss 10C TEM [ Click here for instruction manual] Electron Source: Tungsten Hairpin Accelerating Voltages: 40, 60, 80, and 100 kV Imaging Modes: Brightfield, Darkfield, SAD, HR SAD Specimen Stage: Top entry goniometer Standard stage ± 60° High tilt stage with foot switch Rotational stage with foot switch Magnifications: 1000x - 250,000x Image Recording: 3.25" x 4" sheet film 70mm roll film SONY CCD camera, RS-170 composite/non-composite video output
Click on a category for details on the equipment in the Electron Microscopy Facility: - Light and Electronic-Light Microscopy - Scanning Electron Microscopy - Transmission Electron Microscopy - Cryopreservation - Photographic Equipment - Image Scanners - Computers / Digital Imaging - Color Printers - Equipment for sample preparation - Laboratory equipment Go to the Reference Library page for online manuals for specific units < Back to the Equipment Page >

richard e. edelmann, ph.d.,
supervisor
david g. pennock, ph.d.,
director
matt l. duley, m.s.,
emf specialist

questions? comments?
edlemare@muohio.edu
352 pearson hall
513.529.5712

Original layout design by Steven M. McFarland
Major revision and programing by Michelle Carney